本标准为ISO 20263-2017，标准的英文名称为Microbeam analysis -- Analytical electron microscopy -- Method for the determination of interface position in the cross-sectional image of the layered materials，本标准在2017-11-01发布，在2017-11-01开始实施。
ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.
本标准文件共有52页。 ISO 20263-2017 Microbeam analysis -- Analytical electron microscopy -- Method for the determination of interface p.pdf(4.75 MB)
